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Precision Permittivity Measurement for Low-Loss Thin Planar..:
You, Kok Yeow
;
Sim, Man Seng
Journal of Manufacturing and Materials Processing. 2 (2018) 4 - p. 81 , 2018
Link:
https://doi.org/10.3390/jmmp2040081
RT Journal T1 <Title>Precision Permittivity Measurement for Low-Loss Thin Planar Materials Using Large Coaxial Probe from 1 to 400 MHz</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_jmmp2040081&Exemplar=1&LAN=DE A1 You, Kok Yeow A1 Sim, Man Seng PB MDPI AG YR 2018 SN 2504-4494 JF Journal of Manufacturing and Materials Processing VO 2 IS 4 SP 81 LK http://dx.doi.org/https://doi.org/10.3390/jmmp2040081 DO https://doi.org/10.3390/jmmp2040081 SF ELIB - SuUB Bremen
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