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1 Ergebnisse
1
Channel Shape Effects on Device Instability of Amorphous In..:
Seo, Seung Gi
;
Yu, Seung Jae
;
Kim, Seung Yeob
..
Micromachines. 12 (2020) 1 - p. 2 , 2020
Link:
https://doi.org/10.3390/mi12010002
RT Journal T1
Channel Shape Effects on Device Instability of Amorphous Indium–Gallium–Zinc Oxide Thin Film Transistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_mi12010002&Exemplar=1&LAN=DE A1 Seo, Seung Gi A1 Yu, Seung Jae A1 Kim, Seung Yeob A1 Jeong, Jinheon A1 Jin, Sung Hun PB MDPI AG YR 2020 SN 2072-666X JF Micromachines VO 12 IS 1 SP 2 LK http://dx.doi.org/https://doi.org/10.3390/mi12010002 DO https://doi.org/10.3390/mi12010002 SF ELIB - SuUB Bremen
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