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1 Ergebnisse
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Evaluation on Temperature-Dependent Transient VT Instabilit..:
Wang, Rui
;
Guo, Hui
;
Hou, Qianyu
...
Micromachines. 13 (2022) 7 - p. 1096 , 2022
Link:
https://doi.org/10.3390/mi13071096
RT Journal T1
Evaluation on Temperature-Dependent Transient VT Instability in p-GaN Gate HEMTs under Negative Gate Stress by Fast Sweeping Characterization
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_mi13071096&Exemplar=1&LAN=DE A1 Wang, Rui A1 Guo, Hui A1 Hou, Qianyu A1 Lei, Jianming A1 Wang, Jin A1 Xue, Junjun A1 Liu, Bin A1 Chen, Dunjun A1 Lu, Hai A1 Zhang, Rong A1 Zheng, Youdou PB MDPI AG YR 2022 SN 2072-666X JF Micromachines VO 13 IS 7 SP 1096 LK http://dx.doi.org/https://doi.org/10.3390/mi13071096 DO https://doi.org/10.3390/mi13071096 SF ELIB - SuUB Bremen
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