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1 Ergebnisse
1
Simulation of Single-Event Transient Effect for GaN High-El..:
Wang, Zhiheng
;
Cao, Yanrong
;
Zhang, Xinxiang
...
Micromachines. 14 (2023) 10 - p. 1948 , 2023
Link:
https://doi.org/10.3390/mi14101948
RT Journal T1
Simulation of Single-Event Transient Effect for GaN High-Electron-Mobility Transistor
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_mi14101948&Exemplar=1&LAN=DE A1 Wang, Zhiheng A1 Cao, Yanrong A1 Zhang, Xinxiang A1 Chen, Chuan A1 Wu, Linshan A1 Ma, Maodan A1 Lv, Hanghang A1 Lv, Ling A1 Zheng, Xuefeng A1 Tian, Wenchao A1 Ma, Xiaohua A1 Hao, Yue PB MDPI AG YR 2023 SN 2072-666X JF Micromachines VO 14 IS 10 SP 1948 LK http://dx.doi.org/https://doi.org/10.3390/mi14101948 DO https://doi.org/10.3390/mi14101948 SF ELIB - SuUB Bremen
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