I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Compact Physics Hot-Carrier Degradation Model Valid over a ..:
Tyaginov, Stanislav
;
Bury, Erik
;
Grill, Alexander
...
Micromachines. 14 (2023) 11 - p. 2018 , 2023
Link:
https://doi.org/10.3390/mi14112018
RT Journal T1
Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_mi14112018&Exemplar=1&LAN=DE A1 Tyaginov, Stanislav A1 Bury, Erik A1 Grill, Alexander A1 Yu, Zhuoqing A1 Makarov, Alexander A1 De Keersgieter, An A1 Vexler, Mikhail A1 Vandemaele, Michiel A1 Wang, Runsheng A1 Spessot, Alessio A1 Chasin, Adrian A1 Kaczer, Ben PB MDPI AG YR 2023 SN 2072-666X JF Micromachines VO 14 IS 11 SP 2018 LK http://dx.doi.org/https://doi.org/10.3390/mi14112018 DO https://doi.org/10.3390/mi14112018 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)