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1 Ergebnisse
1
Leakage and Thermal Reliability Optimization of Stacked Nan..:
Li, Cong
;
Shao, Yali
;
Kuang, Fengyu
...
Micromachines. 15 (2024) 4 - p. 424 , 2024
Link:
https://doi.org/10.3390/mi15040424
RT Journal T1
Leakage and Thermal Reliability Optimization of Stacked Nanosheet Field-Effect Transistors with SiC Layers
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_mi15040424&Exemplar=1&LAN=DE A1 Li, Cong A1 Shao, Yali A1 Kuang, Fengyu A1 Liu, Fang A1 Wang, Yunqi A1 Li, Xiaoming A1 Zhuang, Yiqi PB MDPI AG YR 2024 SN 2072-666X JF Micromachines VO 15 IS 4 SP 424 LK http://dx.doi.org/https://doi.org/10.3390/mi15040424 DO https://doi.org/10.3390/mi15040424 SF ELIB - SuUB Bremen
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