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1 Ergebnisse
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A Reliability Investigation of VDMOS Transistors: Performan..:
Živanović, Emilija
;
Veljković, Sandra
;
Mitrović, Nikola
...
Micromachines. 15 (2024) 4 - p. 503 , 2024
Link:
https://doi.org/10.3390/mi15040503
RT Journal T1
A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_mi15040503&Exemplar=1&LAN=DE A1 Živanović, Emilija A1 Veljković, Sandra A1 Mitrović, Nikola A1 Jovanović, Igor A1 Djorić-Veljković, Snežana A1 Paskaleva, Albena A1 Spassov, Dencho A1 Danković, Danijel PB MDPI AG YR 2024 SN 2072-666X JF Micromachines VO 15 IS 4 SP 503 LK http://dx.doi.org/https://doi.org/10.3390/mi15040503 DO https://doi.org/10.3390/mi15040503 SF ELIB - SuUB Bremen
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