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1 Ergebnisse
1
Insight into over Repair of Hot Carrier Degradation by GIDL..:
Chang, Hao
;
Wang, Guilei
;
Yang, Hong
...
Nanomaterials. 13 (2023) 7 - p. 1259 , 2023
Link:
https://doi.org/10.3390/nano13071259
RT Journal T1
Insight into over Repair of Hot Carrier Degradation by GIDL Current in Si p-FinFETs Using Ultra-Fast Measurement Technique
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_nano13071259&Exemplar=1&LAN=DE A1 Chang, Hao A1 Wang, Guilei A1 Yang, Hong A1 Liu, Qianqian A1 Zhou, Longda A1 Ji, Zhigang A1 Yu, Ruixi A1 Wu, Zhenhua A1 Yin, Huaxiang A1 Du, Anyan A1 Li, Junfeng A1 Luo, Jun A1 Zhao, Chao A1 Wang, Wenwu PB MDPI AG YR 2023 SN 2079-4991 JF Nanomaterials VO 13 IS 7 SP 1259 LK http://dx.doi.org/https://doi.org/10.3390/nano13071259 DO https://doi.org/10.3390/nano13071259 SF ELIB - SuUB Bremen
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