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Using Ridge Regression Models to Estimate Grain Yield from ..:
Hernandez, Javier
;
Lobos, Gustavo
;
Matus, Iván
...
Remote Sensing. 7 (2015) 2 - p. 2109-2126 , 2015
Link:
https://doi.org/10.3390/rs70202109
RT Journal T1
Using Ridge Regression Models to Estimate Grain Yield from Field Spectral Data in Bread Wheat (Triticum Aestivum L.) Grown under Three Water Regimes
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_rs70202109&Exemplar=1&LAN=DE A1 Hernandez, Javier A1 Lobos, Gustavo A1 Matus, Iván A1 Del Pozo, Alejandro A1 Silva, Paola A1 Galleguillos, Mauricio PB MDPI AG YR 2015 SN 2072-4292 JF Remote Sensing VO 7 IS 2 SP 2109 OP 2126 LK http://dx.doi.org/https://doi.org/10.3390/rs70202109 DO https://doi.org/10.3390/rs70202109 SF ELIB - SuUB Bremen
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