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1 Ergebnisse
1
High Throughput Phenotyping for Various Traits on Soybean S..:
BAEK, JeongHo
;
Lee, Eungyeong
;
Kim, Nyunhee
...
Sensors. 20 (2020) 1 - p. 248 , 2020
Link:
https://doi.org/10.3390/s20010248
RT Journal T1
High Throughput Phenotyping for Various Traits on Soybean Seeds Using Image Analysis
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_s20010248&Exemplar=1&LAN=DE A1 BAEK, JeongHo A1 Lee, Eungyeong A1 Kim, Nyunhee A1 Kim, Song Lim A1 Choi, Inchan A1 Ji, Hyeonso A1 Chung, Yong Suk A1 Choi, Man-Soo A1 Moon, Jung-Kyung A1 Kim, Kyung-Hwan PB MDPI AG YR 2020 SN 1424-8220 JF Sensors VO 20 IS 1 SP 248 LK http://dx.doi.org/https://doi.org/10.3390/s20010248 DO https://doi.org/10.3390/s20010248 SF ELIB - SuUB Bremen
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