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1 Ergebnisse
1
A Fast Loss Model for Cascode GaN-FETs and Real-Time Degrad..:
Haque, Moinul Shahidul
;
Moniruzzaman, Md
;
Choi, Seungdeog
...
Sensors. 23 (2023) 9 - p. 4395 , 2023
Link:
https://doi.org/10.3390/s23094395
RT Journal T1
A Fast Loss Model for Cascode GaN-FETs and Real-Time Degradation-Sensitive Control of Solid-State Transformers
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_s23094395&Exemplar=1&LAN=DE A1 Haque, Moinul Shahidul A1 Moniruzzaman, Md A1 Choi, Seungdeog A1 Kwak, Sangshin A1 Okilly, Ahmed H. A1 Baek, Jeihoon PB MDPI AG YR 2023 SN 1424-8220 JF Sensors VO 23 IS 9 SP 4395 LK http://dx.doi.org/https://doi.org/10.3390/s23094395 DO https://doi.org/10.3390/s23094395 SF ELIB - SuUB Bremen
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