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1 Ergebnisse
1
Automotive 2.1 μm Full-Depth Deep Trench Isolation CMOS Ima..:
Yoo, Dongsuk
;
Jang, Youngtae
;
Kim, Youngchan
...
Sensors. 23 (2023) 22 - p. 9150 , 2023
Link:
https://doi.org/10.3390/s23229150
RT Journal T1
Automotive 2.1 μm Full-Depth Deep Trench Isolation CMOS Image Sensor with a 120 dB Single-Exposure Dynamic Range
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_s23229150&Exemplar=1&LAN=DE A1 Yoo, Dongsuk A1 Jang, Youngtae A1 Kim, Youngchan A1 Shin, Jihun A1 Lee, Kangsun A1 Park, Seok-Yong A1 Shin, Seungho A1 Lee, Hongsuk A1 Kim, Seojoo A1 Park, Joongseok A1 Park, Cheonho A1 Lim, Moosup A1 Bae, Hyungjin A1 Park, Soeun A1 Jung, Minwook A1 Kim, Sungkwan A1 Choi, Shinyeol A1 Kim, Sejun A1 Heo, Jinkyeong A1 Lee, Hojoon A1 Lee, KyungChoon A1 Jeong, Youngkyun A1 Oh, Youngsun A1 Keel, Min-Sun A1 Kim, Bumsuk A1 Lee, Haechang A1 Ahn, JungChak PB MDPI AG YR 2023 SN 1424-8220 JF Sensors VO 23 IS 22 SP 9150 LK http://dx.doi.org/https://doi.org/10.3390/s23229150 DO https://doi.org/10.3390/s23229150 SF ELIB - SuUB Bremen
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