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1 Ergebnisse
1
Insulator Defect Detection Based on ML-YOLOv5 Algorithm:
Wang, Tong
;
Zhai, Yidi
;
Li, Yuhang
...
Sensors. 24 (2023) 1 - p. 204 , 2023
Link:
https://doi.org/10.3390/s24010204
RT Journal T1
Insulator Defect Detection Based on ML-YOLOv5 Algorithm
UL https://suche.suub.uni-bremen.de/peid=cr-10.3390_s24010204&Exemplar=1&LAN=DE A1 Wang, Tong A1 Zhai, Yidi A1 Li, Yuhang A1 Wang, Weihua A1 Ye, Guoyong A1 Jin, Shaobo PB MDPI AG YR 2023 SN 1424-8220 JF Sensors VO 24 IS 1 SP 204 LK http://dx.doi.org/https://doi.org/10.3390/s24010204 DO https://doi.org/10.3390/s24010204 SF ELIB - SuUB Bremen
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