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1 Ergebnisse
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Change in the defect structure of composition controlled si..:
Shimamoto, K.
;
Tanaka, J.
;
Miura, K.
...
Japanese Journal of Applied Physics. 59 (2020) SP - p. SPPB07 , 2020
Link:
https://doi.org/10.35848/1347-4065/aba9b2
RT Journal T1 <Title>Change in the defect structure of composition controlled single-phase YbFe2O4 epitaxial thin films</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.35848_1347-4065_aba9b2&Exemplar=1&LAN=DE A1 Shimamoto, K. A1 Tanaka, J. A1 Miura, K. A1 Kiriya, D. A1 Yoshimura, T. A1 Fujimura, N. PB IOP Publishing YR 2020 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 59 IS SP SP SPPB07 LK http://dx.doi.org/https://doi.org/10.35848/1347-4065/aba9b2 DO https://doi.org/10.35848/1347-4065/aba9b2 SF ELIB - SuUB Bremen
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