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1 Ergebnisse
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High-temperature reliability of integrated circuit based on..:
Van Cuong, Vuong
;
Ishikawa, Seiji
;
Maeda, Tomonori
...
Japanese Journal of Applied Physics. 59 (2020) 12 - p. 126504 , 2020
Link:
https://doi.org/10.35848/1347-4065/abc924
RT Journal T1
High-temperature reliability of integrated circuit based on 4H-SiC MOSFET with Ni/Nb ohmic contacts for harsh environment applications
UL https://suche.suub.uni-bremen.de/peid=cr-10.35848_1347-4065_abc924&Exemplar=1&LAN=DE A1 Van Cuong, Vuong A1 Ishikawa, Seiji A1 Maeda, Tomonori A1 Sezaki, Hiroshi A1 Meguro, Tetsuya A1 Kuroki, Shin-Ichiro PB IOP Publishing YR 2020 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 59 IS 12 SP 126504 LK http://dx.doi.org/https://doi.org/10.35848/1347-4065/abc924 DO https://doi.org/10.35848/1347-4065/abc924 SF ELIB - SuUB Bremen
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