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1 Ergebnisse
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Variability characteristics and corner effects of gate-all-..:
Ahn, Min-Ju
;
Saraya, Takuya
;
Kobayashi, Masaharu
.
Japanese Journal of Applied Physics. 60 (2021) SB - p. SBBA02 , 2021
Link:
https://doi.org/10.35848/1347-4065/abdb84
RT Journal T1
Variability characteristics and corner effects of gate-all-around (GAA) p-type poly-Si junctionless nanowire/nanosheet transistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.35848_1347-4065_abdb84&Exemplar=1&LAN=DE A1 Ahn, Min-Ju A1 Saraya, Takuya A1 Kobayashi, Masaharu A1 Hiramoto, Toshiro PB IOP Publishing YR 2021 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 60 IS SB SP SBBA02 LK http://dx.doi.org/https://doi.org/10.35848/1347-4065/abdb84 DO https://doi.org/10.35848/1347-4065/abdb84 SF ELIB - SuUB Bremen
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