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1 Ergebnisse
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Yield and leakage current of organic thin-film transistor l..:
Ogasahara, Yasuhiro
;
Kuribara, Kazunori
;
Oshima, Kunihiro
..
Japanese Journal of Applied Physics. 61 (2022) SC - p. SC1044 , 2022
Link:
https://doi.org/10.35848/1347-4065/ac44cf
RT Journal T1 <Title>Yield and leakage current of organic thin-film transistor logic gates toward reliable and low-power operation of large-scale logic circuits for IoT nodes</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.35848_1347-4065_ac44cf&Exemplar=1&LAN=DE A1 Ogasahara, Yasuhiro A1 Kuribara, Kazunori A1 Oshima, Kunihiro A1 Qin, Zhaoxing A1 Sato, Takashi PB IOP Publishing YR 2022 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 61 IS SC SP SC1044 LK http://dx.doi.org/https://doi.org/10.35848/1347-4065/ac44cf DO https://doi.org/10.35848/1347-4065/ac44cf SF ELIB - SuUB Bremen
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