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Carrier lifetime measurement of perovskite films by differe..:
Ohdaira, Keisuke
;
Thi Cam Tu, Huynh
;
Shimazaki, Ai
...
Japanese Journal of Applied Physics. 61 (2022) 6 - p. 068001 , 2022
Link:
https://doi.org/10.35848/1347-4065/ac5d22
RT Journal T1
Carrier lifetime measurement of perovskite films by differential microwave photoconductivity decay
UL https://suche.suub.uni-bremen.de/peid=cr-10.35848_1347-4065_ac5d22&Exemplar=1&LAN=DE A1 Ohdaira, Keisuke A1 Thi Cam Tu, Huynh A1 Shimazaki, Ai A1 Kaneko, Ryuji A1 Sumai, Yuka A1 Shahiduzzaman, Md. A1 Taima, Tetsuya A1 Wakamiya, Atsushi PB IOP Publishing YR 2022 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 61 IS 6 SP 068001 LK http://dx.doi.org/https://doi.org/10.35848/1347-4065/ac5d22 DO https://doi.org/10.35848/1347-4065/ac5d22 SF ELIB - SuUB Bremen
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