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1 Ergebnisse
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Combined FEM and phase field method for reliability design ..:
Kano, Akira
;
Hirohata, Kenji
;
Kato, Mitsuaki
...
Japanese Journal of Applied Physics. 62 (2023) 10 - p. 104001 , 2023
Link:
https://doi.org/10.35848/1347-4065/acf74c
RT Journal T1
Combined FEM and phase field method for reliability design of forward degradation in SiC bipolar device
UL https://suche.suub.uni-bremen.de/peid=cr-10.35848_1347-4065_acf74c&Exemplar=1&LAN=DE A1 Kano, Akira A1 Hirohata, Kenji A1 Kato, Mitsuaki A1 Ota, Chiharu A1 Okada, Aoi A1 Nishio, Johji A1 Shibutani, Yoji PB IOP Publishing YR 2023 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 62 IS 10 SP 104001 LK http://dx.doi.org/https://doi.org/10.35848/1347-4065/acf74c DO https://doi.org/10.35848/1347-4065/acf74c SF ELIB - SuUB Bremen
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