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Characterization of band alignment at a metal–MoS2 interfac..:
Okada, Mitsuhiro
;
Okigawa, Yuki
;
Fujii, Takeshi
...
Japanese Journal of Applied Physics. 63 (2023) 1 - p. 01SP15 , 2023
Link:
https://doi.org/10.35848/1347-4065/acfa07
RT Journal T1
Characterization of band alignment at a metal–MoS2 interface by Kelvin probe force microscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.35848_1347-4065_acfa07&Exemplar=1&LAN=DE A1 Okada, Mitsuhiro A1 Okigawa, Yuki A1 Fujii, Takeshi A1 Endo, Takahiko A1 Chang, Wen Hsin A1 Okada, Naoya A1 Irisawa, Toshifumi A1 Miyata, Yasumitsu A1 Shimizu, Tetsuo A1 Kubo, Toshitaka A1 Yamada, Takatoshi PB IOP Publishing YR 2023 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 63 IS 1 SP 01SP15 LK http://dx.doi.org/https://doi.org/10.35848/1347-4065/acfa07 DO https://doi.org/10.35848/1347-4065/acfa07 SF ELIB - SuUB Bremen
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