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1 Ergebnisse
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TEM characterization of defects in κ-(Inx Ga1−x )2O3 thin f..:
Ueda, Osamu
;
Nishinaka, Hiroyuki
;
Ikenaga, Noriaki
..
Japanese Journal of Applied Physics. 62 (2023) 12 - p. 125501 , 2023
Link:
https://doi.org/10.35848/1347-4065/ad07fb
RT Journal T1
TEM characterization of defects in κ-(Inx Ga1−x )2O3 thin film grown on (001) FZ-grown ε-GaFeO3 substrate by mist CVD
UL https://suche.suub.uni-bremen.de/peid=cr-10.35848_1347-4065_ad07fb&Exemplar=1&LAN=DE A1 Ueda, Osamu A1 Nishinaka, Hiroyuki A1 Ikenaga, Noriaki A1 Hasuike, Noriyuki A1 Yoshimoto, Masahiro PB IOP Publishing YR 2023 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 62 IS 12 SP 125501 LK http://dx.doi.org/https://doi.org/10.35848/1347-4065/ad07fb DO https://doi.org/10.35848/1347-4065/ad07fb SF ELIB - SuUB Bremen
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