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Investigation into the impact of bulk defects in the drift ..:
Gao, Xuchen
;
He, Feng
;
Huang, Fuping
...
Japanese Journal of Applied Physics. 63 (2024) 5 - p. 054003 , 2024
Link:
https://doi.org/10.35848/1347-4065/ad40eb
RT Journal T1 <Title>Investigation into the impact of bulk defects in the drift layer on the electrical properties of GaN-based trench Schottky barrier diodes</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.35848_1347-4065_ad40eb&Exemplar=1&LAN=DE A1 Gao, Xuchen A1 He, Feng A1 Huang, Fuping A1 Wang, Zhizhong A1 Chu, Chunshuang A1 Tian, Kangkai A1 Zhang, Yonghui A1 Zhang, Zi-Hui PB IOP Publishing YR 2024 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 63 IS 5 SP 054003 LK http://dx.doi.org/https://doi.org/10.35848/1347-4065/ad40eb DO https://doi.org/10.35848/1347-4065/ad40eb SF ELIB - SuUB Bremen
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