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1 Ergebnisse
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Research on single event effects and hardening design of LD..:
Wang, Ying
;
Zhou, Wei
;
Peng, Ling
...
Japanese Journal of Applied Physics. 63 (2024) 8 - p. 081001 , 2024
Link:
https://doi.org/10.35848/1347-4065/ad6b6b
RT Journal T1 <Title>Research on single event effects and hardening design of LDMOS transistors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.35848_1347-4065_ad6b6b&Exemplar=1&LAN=DE A1 Wang, Ying A1 Zhou, Wei A1 Peng, Ling A1 Chu, Fei A1 Wang, Zongmin A1 Kong, Ying A1 Hu, Guicai A1 Hu, Yifan PB IOP Publishing YR 2024 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 63 IS 8 SP 081001 LK http://dx.doi.org/https://doi.org/10.35848/1347-4065/ad6b6b DO https://doi.org/10.35848/1347-4065/ad6b6b SF ELIB - SuUB Bremen
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