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An atomic force microscope integrated with a helium ion mic..:
Andany, Santiago H
;
Hlawacek, Gregor
;
Hummel, Stefan
...
Beilstein Journal of Nanotechnology. 11 (2020) - p. 1272-1279 , 2020
Link:
https://doi.org/10.3762/bjnano.11.111
RT Journal T1
An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization
UL https://suche.suub.uni-bremen.de/peid=cr-10.3762_bjnano.11.111&Exemplar=1&LAN=DE A1 Andany, Santiago H A1 Hlawacek, Gregor A1 Hummel, Stefan A1 Brillard, Charlène A1 Kangül, Mustafa A1 Fantner, Georg E PB Beilstein Institut YR 2020 SN 2190-4286 JF Beilstein Journal of Nanotechnology VO 11 SP 1272 OP 1279 LK http://dx.doi.org/https://doi.org/10.3762/bjnano.11.111 DO https://doi.org/10.3762/bjnano.11.111 SF ELIB - SuUB Bremen
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