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The microwave properties of Ag(Ta0.8Nb0.2)O3 thick film int..:
Lee, Ku-Tak
;
Koh, Jung-Hyuk
Journal of the Korean Physical Society. 60 (2012) 2 - p. 276-279 , 2012
Link:
https://doi.org/10.3938/jkps.60.276
RT Journal T1 <Title>The microwave properties of Ag(Ta0.8Nb0.2)O3 thick film interdigital capacitors on alumina substrates</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.3938_jkps.60.276&Exemplar=1&LAN=DE A1 Lee, Ku-Tak A1 Koh, Jung-Hyuk PB Korean Physical Society YR 2012 SN 0374-4884 SN 1976-8524 JF Journal of the Korean Physical Society VO 60 IS 2 SP 276 OP 279 LK http://dx.doi.org/https://doi.org/10.3938/jkps.60.276 DO https://doi.org/10.3938/jkps.60.276 SF ELIB - SuUB Bremen
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