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1 Ergebnisse
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Electrical characterization of MIS devices using PECVD SiNx..:
Yoo, Jin-Su
;
Cho, Jun-Sik
;
Park, Joo-Hyung
...
Journal of the Korean Physical Society. 61 (2012) 1 - p. 89-92 , 2012
Link:
https://doi.org/10.3938/jkps.61.89
RT Journal T1 <Title>Electrical characterization of MIS devices using PECVD SiNx:H films for application of silicon solar cells</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.3938_jkps.61.89&Exemplar=1&LAN=DE A1 Yoo, Jin-Su A1 Cho, Jun-Sik A1 Park, Joo-Hyung A1 Ahn, Seung-Kyu A1 Shin, Kee-Shik A1 Yoon, Kyung-Hoon A1 Yi, Junsin PB Korean Physical Society YR 2012 SN 0374-4884 SN 1976-8524 JF Journal of the Korean Physical Society VO 61 IS 1 SP 89 OP 92 LK http://dx.doi.org/https://doi.org/10.3938/jkps.61.89 DO https://doi.org/10.3938/jkps.61.89 SF ELIB - SuUB Bremen
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