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1 Ergebnisse
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Thickness analysis of LiF thin films by using 7Li(p,n) and ..:
Kim, Gi-Dong
;
Woo, Hyung-Joo
;
Choi, Han-Woo
.
Journal of the Korean Physical Society. 62 (2013) 3 - p. 413-418 , 2013
Link:
https://doi.org/10.3938/jkps.62.413
RT Journal T1 <Title>Thickness analysis of LiF thin films by using 7Li(p,n) and 19F(p,αγ) nuclear reactions</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.3938_jkps.62.413&Exemplar=1&LAN=DE A1 Kim, Gi-Dong A1 Woo, Hyung-Joo A1 Choi, Han-Woo A1 Park, Jung-Heun PB Korean Physical Society YR 2013 SN 0374-4884 SN 1976-8524 JF Journal of the Korean Physical Society VO 62 IS 3 SP 413 OP 418 LK http://dx.doi.org/https://doi.org/10.3938/jkps.62.413 DO https://doi.org/10.3938/jkps.62.413 SF ELIB - SuUB Bremen
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