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Growth and characterization of a high-quality Al0.45Ga0.55N..:
Jeon, Seong-Ran
;
Park, Si-Hyun
Journal of the Korean Physical Society. 63 (2013) 8 - p. 1625-1629 , 2013
Link:
https://doi.org/10.3938/jkps.63.1625
RT Journal T1 <Title>Growth and characterization of a high-quality Al0.45Ga0.55N layer with AlGaN/AlN superlattices</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.3938_jkps.63.1625&Exemplar=1&LAN=DE A1 Jeon, Seong-Ran A1 Park, Si-Hyun PB Korean Physical Society YR 2013 SN 0374-4884 SN 1976-8524 JF Journal of the Korean Physical Society VO 63 IS 8 SP 1625 OP 1629 LK http://dx.doi.org/https://doi.org/10.3938/jkps.63.1625 DO https://doi.org/10.3938/jkps.63.1625 SF ELIB - SuUB Bremen
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