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1 Ergebnisse
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Thickness dependences of the structural optical, and electr..:
Ahn, Heejin
;
Um, Youngho
Journal of the Korean Physical Society. 64 (2014) 10 - p. 1600-1604 , 2014
Link:
https://doi.org/10.3938/jkps.64.1600
RT Journal T1 <Title>Thickness dependences of the structural optical, and electrical properties of Cu2 Se thin films grown by using DC magnetron sputtering</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.3938_jkps.64.1600&Exemplar=1&LAN=DE A1 Ahn, Heejin A1 Um, Youngho PB Korean Physical Society YR 2014 SN 0374-4884 SN 1976-8524 JF Journal of the Korean Physical Society VO 64 IS 10 SP 1600 OP 1604 LK http://dx.doi.org/https://doi.org/10.3938/jkps.64.1600 DO https://doi.org/10.3938/jkps.64.1600 SF ELIB - SuUB Bremen
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