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Optical characterization of the PtSi/Si by using spectrosco..:
Le, Van Long
;
Kim, Tae Jung
;
Park, Han Gyeol
...
Journal of the Korean Physical Society. 69 (2016) 3 - p. 291-296 , 2016
Link:
https://doi.org/10.3938/jkps.69.291
RT Journal T1 <Title>Optical characterization of the PtSi/Si by using spectroscopic ellipsometry</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.3938_jkps.69.291&Exemplar=1&LAN=DE A1 Le, Van Long A1 Kim, Tae Jung A1 Park, Han Gyeol A1 Kim, Hwa Seob A1 Yoo, Chang Hyun A1 Kim, Hyoung Uk A1 Kim, Young Dong A1 Kim, Junsoo A1 Im, Solyee A1 Choi, Won Chul A1 Moon, Seung Eon A1 Nam, Eun Soo PB Korean Physical Society YR 2016 SN 0374-4884 SN 1976-8524 JF Journal of the Korean Physical Society VO 69 IS 3 SP 291 OP 296 LK http://dx.doi.org/https://doi.org/10.3938/jkps.69.291 DO https://doi.org/10.3938/jkps.69.291 SF ELIB - SuUB Bremen
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