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1 Ergebnisse
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Bias stress instability of double-gate a-IGZO TFTs on polyi..:
Cho, Won-Ju
;
Ahn, Min-Ju
Journal of the Korean Physical Society. 71 (2017) 6 - p. 325-328 , 2017
Link:
https://doi.org/10.3938/jkps.71.325
RT Journal T1 <Title>Bias stress instability of double-gate a-IGZO TFTs on polyimide substrate</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.3938_jkps.71.325&Exemplar=1&LAN=DE A1 Cho, Won-Ju A1 Ahn, Min-Ju PB Korean Physical Society YR 2017 SN 0374-4884 SN 1976-8524 JF Journal of the Korean Physical Society VO 71 IS 6 SP 325 OP 328 LK http://dx.doi.org/https://doi.org/10.3938/jkps.71.325 DO https://doi.org/10.3938/jkps.71.325 SF ELIB - SuUB Bremen
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