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1 Ergebnisse
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Fabrication of Si-based AFM Probe with High Q-factor for Fa..:
Bahn, Sebin
;
Choi, Soo Bong
;
Park, Woongkyu
..
Journal of the Korean Physical Society. 74 (2019) 2 - p. 94-97 , 2019
Link:
https://doi.org/10.3938/jkps.74.94
RT Journal T1 <Title>Fabrication of Si-based AFM Probe with High Q-factor for Fast Non-Contact Mode Scanning</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.3938_jkps.74.94&Exemplar=1&LAN=DE A1 Bahn, Sebin A1 Choi, Soo Bong A1 Park, Woongkyu A1 Jeong, Hae-Yong A1 Park, Kyung-Ho PB Korean Physical Society YR 2019 SN 0374-4884 SN 1976-8524 JF Journal of the Korean Physical Society VO 74 IS 2 SP 94 OP 97 LK http://dx.doi.org/https://doi.org/10.3938/jkps.74.94 DO https://doi.org/10.3938/jkps.74.94 SF ELIB - SuUB Bremen
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