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Development of a Fast Sample-exchange System for Fixed Targ..:
Nam, Daewoong
;
Kim, Sangsoo
;
Kim, Myong-jin
.
Journal of the Korean Physical Society. 76 (2020) 6 - p. 448-452 , 2020
Link:
https://doi.org/10.3938/jkps.76.448
RT Journal T1 <Title>Development of a Fast Sample-exchange System for Fixed Target Single-shot Imaging at PAL-XFEL</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.3938_jkps.76.448&Exemplar=1&LAN=DE A1 Nam, Daewoong A1 Kim, Sangsoo A1 Kim, Myong-jin A1 Kim, Seonghan PB Korean Physical Society YR 2020 SN 0374-4884 SN 1976-8524 JF Journal of the Korean Physical Society VO 76 IS 6 SP 448 OP 452 LK http://dx.doi.org/https://doi.org/10.3938/jkps.76.448 DO https://doi.org/10.3938/jkps.76.448 SF ELIB - SuUB Bremen
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