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Study of Multi-twin Defects Generated in GaAs and InP Films..:
Lee, Juhee
;
Shin, Hyunsu
;
Lee, In-Geun
.
Journal of the Korean Physical Society. 77 (2020) 7 - p. 592-597 , 2020
Link:
https://doi.org/10.3938/jkps.77.592
RT Journal T1 <Title>Study of Multi-twin Defects Generated in GaAs and InP Films on Nanopatterned Si via Transmission Electron Microscopy</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.3938_jkps.77.592&Exemplar=1&LAN=DE A1 Lee, Juhee A1 Shin, Hyunsu A1 Lee, In-Geun A1 Ko, Dae-Hong PB Korean Physical Society YR 2020 SN 0374-4884 SN 1976-8524 JF Journal of the Korean Physical Society VO 77 IS 7 SP 592 OP 597 LK http://dx.doi.org/https://doi.org/10.3938/jkps.77.592 DO https://doi.org/10.3938/jkps.77.592 SF ELIB - SuUB Bremen
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