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1 Ergebnisse
1
Chemical Identification of Sub-20 nm Defects and Sub-Monola..:
Nowak, Derek
;
O'Reilly, Padraic
;
Park, Sung
.
Solid State Phenomena. 346 (2023) - p. 204-209 , 2023
Link:
https://doi.org/10.4028/p-0njbb4
RT Journal T1
Chemical Identification of Sub-20 nm Defects and Sub-Monolayer Residues with Nano IR PiFM
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_p-0njbb4&Exemplar=1&LAN=DE A1 Nowak, Derek A1 O'Reilly, Padraic A1 Park, Sung A1 Albrecht, Tom PB Trans Tech Publications, Ltd. YR 2023 SN 1662-9779 JF Solid State Phenomena VO 346 SP 204 OP 209 LK http://dx.doi.org/https://doi.org/10.4028/p-0njbb4 DO https://doi.org/10.4028/p-0njbb4 SF ELIB - SuUB Bremen
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