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1 Ergebnisse
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Impact of Recovery Characteristics on Switching Loss of SiC..:
Tominaga, Takaaki
;
Iwamatsu, Toshiaki
;
Nakao, Yukiyasu
...
Materials Science Forum. 1062 (2022) - p. 447-451 , 2022
Link:
https://doi.org/10.4028/p-0uk0j4
RT Journal T1
Impact of Recovery Characteristics on Switching Loss of SiC MOSFETs
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_p-0uk0j4&Exemplar=1&LAN=DE A1 Tominaga, Takaaki A1 Iwamatsu, Toshiaki A1 Nakao, Yukiyasu A1 Amishiro, Hiroyuki A1 Watanabe, Hiroshi A1 Miura, Naruhisa A1 Yamakawa, Satoshi A1 Nakata, Shuhei PB Trans Tech Publications, Ltd. YR 2022 SN 1662-9752 JF Materials Science Forum VO 1062 SP 447 OP 451 LK http://dx.doi.org/https://doi.org/10.4028/p-0uk0j4 DO https://doi.org/10.4028/p-0uk0j4 SF ELIB - SuUB Bremen
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