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1 Ergebnisse
1
Charge State Control over Point Defects in Sic Devices:
Bathen, Marianne Etzelmüller
;
Selnesaunet, Gard M.
;
Enga, Marius Johan
...
Defect and Diffusion Forum. 425 (2023) - p. 35-42 , 2023
Link:
https://doi.org/10.4028/p-6ho92o
RT Journal T1
Charge State Control over Point Defects in Sic Devices
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_p-6ho92o&Exemplar=1&LAN=DE A1 Bathen, Marianne Etzelmüller A1 Selnesaunet, Gard M. A1 Enga, Marius Johan A1 Kjeldby, Snorre B. A1 Müting, Johanna A1 Vines, Lasse A1 Grossner, Ulrike PB Trans Tech Publications, Ltd. YR 2023 SN 1662-9507 JF Defect and Diffusion Forum VO 425 SP 35 OP 42 LK http://dx.doi.org/https://doi.org/10.4028/p-6ho92o DO https://doi.org/10.4028/p-6ho92o SF ELIB - SuUB Bremen
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