I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Proven Power Cycling Reliability of Ohmic Annealing Free Si..:
Guiot, Eric
;
Allibert, Frédéric
;
Leib, Jürgen
...
Materials Science Forum. 1092 (2023) - p. 201-207 , 2023
Link:
https://doi.org/10.4028/p-777hqg
RT Journal T1
Proven Power Cycling Reliability of Ohmic Annealing Free SiC Power Device through the Use of SmartSiCTM Substrate
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_p-777hqg&Exemplar=1&LAN=DE A1 Guiot, Eric A1 Allibert, Frédéric A1 Leib, Jürgen A1 Becker, Tom A1 Schwarzenbach, Walter A1 Hellinger, Carsten A1 Erlbacher, Tobias A1 Rouchier, Séverin PB Trans Tech Publications, Ltd. YR 2023 SN 1662-9752 JF Materials Science Forum VO 1092 SP 201 OP 207 LK http://dx.doi.org/https://doi.org/10.4028/p-777hqg DO https://doi.org/10.4028/p-777hqg SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)