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1 Ergebnisse
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Automatic Image Analysis of Stackingfault:
Muoio, Annamaria
;
Calabretta, Cristiano
;
Scuderi, Viviana
..
Materials Science Forum. 1062 (2022) - p. 283-287 , 2022
Link:
https://doi.org/10.4028/p-ad93l3
RT Journal T1
Automatic Image Analysis of Stackingfault
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_p-ad93l3&Exemplar=1&LAN=DE A1 Muoio, Annamaria A1 Calabretta, Cristiano A1 Scuderi, Viviana A1 Zimbone, Massimo A1 La Via, Francesco PB Trans Tech Publications, Ltd. YR 2022 SN 1662-9752 JF Materials Science Forum VO 1062 SP 283 OP 287 LK http://dx.doi.org/https://doi.org/10.4028/p-ad93l3 DO https://doi.org/10.4028/p-ad93l3 SF ELIB - SuUB Bremen
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