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1 Ergebnisse
1
Electrical Scanning Probe Microscopy Investigation of Schot..:
Giannazzo, Filippo
;
Fiorenza, Patrick
;
Schiliro, Emanuela
...
Materials Science Forum. 1062 (2022) - p. 400-405 , 2022
Link:
https://doi.org/10.4028/p-cl40be
RT Journal T1
Electrical Scanning Probe Microscopy Investigation of Schottky and Metal-Oxide Junctions on Hetero-Epitaxial 3C-SiС on Silicon
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_p-cl40be&Exemplar=1&LAN=DE A1 Giannazzo, Filippo A1 Fiorenza, Patrick A1 Schiliro, Emanuela A1 Di Franco, Salvatore A1 Monnoye, Sylvain A1 Mank, Hugues A1 Zielinski, Marcin A1 La Via, Francesco A1 Roccaforte, Fabrizio PB Trans Tech Publications, Ltd. YR 2022 SN 1662-9752 JF Materials Science Forum VO 1062 SP 400 OP 405 LK http://dx.doi.org/https://doi.org/10.4028/p-cl40be DO https://doi.org/10.4028/p-cl40be SF ELIB - SuUB Bremen
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