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1 Ergebnisse
1
Non-Destructive Quantification of In-Plane Depth Distributi..:
Dojima, Daichi
;
Shigematsu, Koki
;
Tayake, Kaito
..
Defect and Diffusion Forum. 434 (2024) - p. 157-163 , 2024
Link:
https://doi.org/10.4028/p-csr8qq
RT Journal T1
Non-Destructive Quantification of In-Plane Depth Distribution of Sub-Surface Damage on 4H-SiC Wafers Using Laser Light Scattering
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_p-csr8qq&Exemplar=1&LAN=DE A1 Dojima, Daichi A1 Shigematsu, Koki A1 Tayake, Kaito A1 Toda, Kohei A1 Kaneko, Tadaaki PB Trans Tech Publications, Ltd. YR 2024 SN 1662-9507 JF Defect and Diffusion Forum VO 434 SP 157 OP 163 LK http://dx.doi.org/https://doi.org/10.4028/p-csr8qq DO https://doi.org/10.4028/p-csr8qq SF ELIB - SuUB Bremen
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