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1 Ergebnisse
1
Analysis of Strain in Ion Implanted 4H-SiC by Fringes Obser..:
Chen, Ze Yu
;
Liu, Yafei
;
Peng, Hong Yu
...
Defect and Diffusion Forum. 426 (2023) - p. 51-56 , 2023
Link:
https://doi.org/10.4028/p-di3si0
RT Journal T1
Analysis of Strain in Ion Implanted 4H-SiC by Fringes Observed in Synchrotron X-Ray Topography
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_p-di3si0&Exemplar=1&LAN=DE A1 Chen, Ze Yu A1 Liu, Yafei A1 Peng, Hong Yu A1 Cheng, Qianyu A1 Hu, Shan Shan A1 Raghothamachar, Balaji A1 Dudley, Michael A1 Ghandi, Reza A1 Kennerly, Stacey A1 Thieberger, Peter PB Trans Tech Publications, Ltd. YR 2023 SN 1662-9507 JF Defect and Diffusion Forum VO 426 SP 51 OP 56 LK http://dx.doi.org/https://doi.org/10.4028/p-di3si0 DO https://doi.org/10.4028/p-di3si0 SF ELIB - SuUB Bremen
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