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1 Ergebnisse
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Pulsed Forward Bias Body Diode Stress of 1700 V SiC MOSFETs..:
Kochoska, Sara
;
Domeij, Martin
;
Sunkari, Swapna
...
Materials Science Forum. 1062 (2022) - p. 554-559 , 2022
Link:
https://doi.org/10.4028/p-nc73ur
RT Journal T1
Pulsed Forward Bias Body Diode Stress of 1700 V SiC MOSFETs with Individual Mapping of Basal Plane Dislocations
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_p-nc73ur&Exemplar=1&LAN=DE A1 Kochoska, Sara A1 Domeij, Martin A1 Sunkari, Swapna A1 Justice, Joshua A1 Das, Hrishikesh A1 Pham, Thanh Toan A1 Franchi, Jimmy A1 Maslougkas, Sotirios A1 Lee, Ho Jung A1 Hu, Xue Qing A1 Neyer, Thomas PB Trans Tech Publications, Ltd. YR 2022 SN 1662-9752 JF Materials Science Forum VO 1062 SP 554 OP 559 LK http://dx.doi.org/https://doi.org/10.4028/p-nc73ur DO https://doi.org/10.4028/p-nc73ur SF ELIB - SuUB Bremen
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