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Structural and Electrical Characterization of Ni-Based Ohmi..:
Badalà, Paolo
;
Smecca, Emanuele
;
Rascunà, Simone
...
Materials Science Forum. 1062 (2022) - p. 417-421 , 2022
Link:
https://doi.org/10.4028/p-x34i2i
RT Journal T1
Structural and Electrical Characterization of Ni-Based Ohmic Contacts on 4H-SiC Formed by Solid-State Laser Annealing
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_p-x34i2i&Exemplar=1&LAN=DE A1 Badalà, Paolo A1 Smecca, Emanuele A1 Rascunà, Simone A1 Bongiorno, Corrado A1 Carria, Egidio A1 Bassi, Anna A1 Bellocchi, Gabriele A1 Castorina, Silvia A1 Tringali, Cristina A1 La Magna, Antonino A1 Alberti, Alessandra PB Trans Tech Publications, Ltd. YR 2022 SN 1662-9752 JF Materials Science Forum VO 1062 SP 417 OP 421 LK http://dx.doi.org/https://doi.org/10.4028/p-x34i2i DO https://doi.org/10.4028/p-x34i2i SF ELIB - SuUB Bremen
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