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AC-Stress Degradation in SiC MOSFETs:
Lelis, Aivars J.
;
Habersat, Daniel B.
Materials Science Forum. 1092 (2023) - p. 151-155 , 2023
Link:
https://doi.org/10.4028/p-y82029
RT Journal T1 <Title>AC-Stress Degradation in SiC MOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_p-y82029&Exemplar=1&LAN=DE A1 Lelis, Aivars J. A1 Habersat, Daniel B. PB Trans Tech Publications, Ltd. YR 2023 SN 1662-9752 JF Materials Science Forum VO 1092 SP 151 OP 155 LK http://dx.doi.org/https://doi.org/10.4028/p-y82029 DO https://doi.org/10.4028/p-y82029 SF ELIB - SuUB Bremen
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