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Influence of Xe Ion-Bombardment on the Substrate Microstruc..:
Miranda, Thaís Helena Carvalho
;
Vales, Sandra
;
Becerra, Erika Ochoa
...
Advanced Materials Research. 996 (2014) - p. 841-847 , 2014
Link:
https://doi.org/10.4028/www.scientific.net/amr.996.841
RT Journal T1
Influence of Xe Ion-Bombardment on the Substrate Microstructure and the Residual Stresses of Tin Coatings Deposited by Plasma Reactive Sputtering onto AISI 4140 Steel
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_amr.996.841&Exemplar=1&LAN=DE A1 Miranda, Thaís Helena Carvalho A1 Vales, Sandra A1 Becerra, Erika Ochoa A1 Droppa, Roosevelt A1 Brito, Pedro A1 Garcia, Jose Luis A1 Alvarez, Fernando A1 Pinto, Haroldo PB Trans Tech Publications, Ltd. YR 2014 SN 1662-8985 JF Advanced Materials Research VO 996 SP 841 OP 847 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/amr.996.841 DO https://doi.org/10.4028/www.scientific.net/amr.996.841 SF ELIB - SuUB Bremen
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