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1 Ergebnisse
1
Time-Resolved X-Ray Stress Analysis in Multilayered Thin Fi..:
Guillou, Raphaëlle
;
Renault, Pierre-Olivier
;
Le Bourhis, Eric
...
Advanced Materials Research. 996 (2014) - p. 878-883 , 2014
Link:
https://doi.org/10.4028/www.scientific.net/amr.996.878
RT Journal T1
Time-Resolved X-Ray Stress Analysis in Multilayered Thin Films during Continuous Loading: Use of 2D Remote Detection
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_amr.996.878&Exemplar=1&LAN=DE A1 Guillou, Raphaëlle A1 Renault, Pierre-Olivier A1 Le Bourhis, Eric A1 Goudeau, Philippe A1 Godard, Pierre A1 Geandier, Guillaume A1 Faurie, Damien A1 Thiaudière, Dominique A1 Mocuta, Cristian PB Trans Tech Publications, Ltd. YR 2014 SN 1662-8985 JF Advanced Materials Research VO 996 SP 878 OP 883 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/amr.996.878 DO https://doi.org/10.4028/www.scientific.net/amr.996.878 SF ELIB - SuUB Bremen
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