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Analysis of Stress Induced Voiding Using by Finite Element ..:
Shigeyama, Haruhisa
;
Yokobori Jr., A. Toshimitsu
;
Ohmi, Toshihito
.
Defect and Diffusion Forum. 326-328 (2012) - p. 632-640 , 2012
Link:
https://doi.org/10.4028/www.scientific.net/ddf.326-328..
RT Journal T1
Analysis of Stress Induced Voiding Using by Finite Element Analysis Coupled with Finite Difference Analysis
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_ddf.326-328.632&Exemplar=1&LAN=DE A1 Shigeyama, Haruhisa A1 Yokobori Jr., A. Toshimitsu A1 Ohmi, Toshihito A1 Nemoto, Takenao PB Trans Tech Publications, Ltd. YR 2012 SN 1662-9507 JF Defect and Diffusion Forum VO 326-328 SP 632 OP 640 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/ddf.326-328.632 DO https://doi.org/10.4028/www.scientific.net/ddf.326-328.632 SF ELIB - SuUB Bremen
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