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1 Ergebnisse
1
Enhanced Sensitivity of Pt/NiO Gate Based AlGaN/GaN C-HEMT ..:
Rýger, Ivan
;
Vanko, Gabriel
;
Lalinský, Tibor
...
Key Engineering Materials. 605 (2014) - p. 491-494 , 2014
Link:
https://doi.org/10.4028/www.scientific.net/kem.605.491
RT Journal T1
Enhanced Sensitivity of Pt/NiO Gate Based AlGaN/GaN C-HEMT Hydrogen Sensor
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_kem.605.491&Exemplar=1&LAN=DE A1 Rýger, Ivan A1 Vanko, Gabriel A1 Lalinský, Tibor A1 Dzuba, Jaroslav A1 Vallo, Martin A1 Kunzo, Pavol A1 Vávra, Ivo PB Trans Tech Publications, Ltd. YR 2014 SN 1662-9795 JF Key Engineering Materials VO 605 SP 491 OP 494 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/kem.605.491 DO https://doi.org/10.4028/www.scientific.net/kem.605.491 SF ELIB - SuUB Bremen
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