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1 Ergebnisse
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Statistical Analysis of Killer and Non-Killer Defects in Si..:
Das, Hrishikesh
;
Sunkari, Swapna
;
Justice, Joshua
...
Materials Science Forum. 1004 (2020) - p. 458-463 , 2020
Link:
https://doi.org/10.4028/www.scientific.net/msf.1004.45
RT Journal T1
Statistical Analysis of Killer and Non-Killer Defects in SiC and the Impacts to Device Performance
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_msf.1004.458&Exemplar=1&LAN=DE A1 Das, Hrishikesh A1 Sunkari, Swapna A1 Justice, Joshua A1 Pham, Helen A1 Park, George A1 Seo, Young Ho PB Trans Tech Publications, Ltd. YR 2020 SN 1662-9752 JF Materials Science Forum VO 1004 SP 458 OP 463 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/msf.1004.458 DO https://doi.org/10.4028/www.scientific.net/msf.1004.458 SF ELIB - SuUB Bremen
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